Structure and Elemental Composition of Pb1 – xSnxS Films

In this paper by the methods of diffractometry, scanning and atomic force microscopy, X-ray characteristic radiation induced by focused proton beam (PIXE), Rutherford backscattering of helium-4 ions we have investigated Pb1 – xSnxS films obtained by "hot wall". It was found that layers obt...

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Bibliographic Details
Main Authors: P.V. Koval, А.S. Оpanasyuk, A.I. Turavets, I.S. Tashlykov, A.A. Ponomarev, P. Zhukowski
Format: Article
Language:English
Published: Sumy State University 2015-06-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2015/2/articles/jnep_2015_V7_02013.pdf
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