Enhanced Vision-Based Quality Inspection: A Multiview Artificial Intelligence Framework for Defect Detection

Automated defect detection is a critical component of modern industrial quality control. However, it is particularly difficult to identify subtle defects such as scratches on metallic surfaces. Therefore, this paper investigates the effectiveness of multiview deep learning approaches for improved de...

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Bibliographic Details
Main Authors: Geethika Bhavanasi, Davy Neven, Manuel Arteaga, Sina Ditzel, Sam Dehaeck, Abdellatif Bey-Temsamani
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/25/6/1703
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