The Reliability, Testing and Evaluation of Hybrid Microcircuits
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Format: | Article |
Language: | English |
Published: |
Wiley
1977-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.4.213 |
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_version_ | 1832549937144922112 |
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author | A. H. George |
author_facet | A. H. George |
author_sort | A. H. George |
collection | DOAJ |
format | Article |
id | doaj-art-60ecc9d274b046a8be33cd6e90ab8bee |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1977-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-60ecc9d274b046a8be33cd6e90ab8bee2025-02-03T06:08:14ZengWileyActive and Passive Electronic Components0882-75161563-50311977-01-0143-421321710.1155/APEC.4.213The Reliability, Testing and Evaluation of Hybrid MicrocircuitsA. H. Georgehttp://dx.doi.org/10.1155/APEC.4.213 |
spellingShingle | A. H. George The Reliability, Testing and Evaluation of Hybrid Microcircuits Active and Passive Electronic Components |
title | The Reliability, Testing and Evaluation of Hybrid Microcircuits |
title_full | The Reliability, Testing and Evaluation of Hybrid Microcircuits |
title_fullStr | The Reliability, Testing and Evaluation of Hybrid Microcircuits |
title_full_unstemmed | The Reliability, Testing and Evaluation of Hybrid Microcircuits |
title_short | The Reliability, Testing and Evaluation of Hybrid Microcircuits |
title_sort | reliability testing and evaluation of hybrid microcircuits |
url | http://dx.doi.org/10.1155/APEC.4.213 |
work_keys_str_mv | AT ahgeorge thereliabilitytestingandevaluationofhybridmicrocircuits AT ahgeorge reliabilitytestingandevaluationofhybridmicrocircuits |