A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling
Counterfeit electronic components are known to enter supply chains through recycling, with these already-aged components creating serious reliability risks, particularly for critical infrastructure systems. A number of recycled integrated circuit (IC) risk mitigation approaches have been proposed, b...
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Open Journal of Circuits and Systems |
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| Online Access: | https://ieeexplore.ieee.org/document/10736936/ |
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| author | Alexandros Dimopoulos Mihai Sima Stephen W. Neville |
| author_facet | Alexandros Dimopoulos Mihai Sima Stephen W. Neville |
| author_sort | Alexandros Dimopoulos |
| collection | DOAJ |
| description | Counterfeit electronic components are known to enter supply chains through recycling, with these already-aged components creating serious reliability risks, particularly for critical infrastructure systems. A number of recycled integrated circuit (IC) risk mitigation approaches have been proposed, but these generally lack pragmatic feasibility. This work proposes a novel real-world deployable on-chip sensor that: 1) is tamper-resistant by exploiting persistent changes caused by hot carrier injection (HCI); 2) generates a DC signal measurable by common low-cost test equipment; and 3) reuses an existing I/O interface, including existing pins; while 4) requiring a very small footprint. Combining this sensor with a random sample-based testing strategy allows for low-cost and time efficient detection of fraudulently recycled batches of ICs. Through simulation-based validation using process-accurate models of a 65 nm technology we show that employing a random sample size as small as 130 is sufficient for identifying such batches with a statistical significance level of 0.01. |
| format | Article |
| id | doaj-art-60c2c913c6fb44dc9253aba41c42289a |
| institution | Kabale University |
| issn | 2644-1225 |
| language | English |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Open Journal of Circuits and Systems |
| spelling | doaj-art-60c2c913c6fb44dc9253aba41c42289a2025-01-21T00:02:56ZengIEEEIEEE Open Journal of Circuits and Systems2644-12252024-01-01534134810.1109/OJCAS.2024.348707210736936A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC SignallingAlexandros Dimopoulos0https://orcid.org/0000-0002-8929-5321Mihai Sima1https://orcid.org/0000-0002-1945-5190Stephen W. Neville2Department of Electrical and Computer Engineering, University of Victoria, Victoria, BC, CanadaDepartment of Electrical and Computer Engineering, University of Victoria, Victoria, BC, CanadaDepartment of Electrical and Computer Engineering, University of Victoria, Victoria, BC, CanadaCounterfeit electronic components are known to enter supply chains through recycling, with these already-aged components creating serious reliability risks, particularly for critical infrastructure systems. A number of recycled integrated circuit (IC) risk mitigation approaches have been proposed, but these generally lack pragmatic feasibility. This work proposes a novel real-world deployable on-chip sensor that: 1) is tamper-resistant by exploiting persistent changes caused by hot carrier injection (HCI); 2) generates a DC signal measurable by common low-cost test equipment; and 3) reuses an existing I/O interface, including existing pins; while 4) requiring a very small footprint. Combining this sensor with a random sample-based testing strategy allows for low-cost and time efficient detection of fraudulently recycled batches of ICs. Through simulation-based validation using process-accurate models of a 65 nm technology we show that employing a random sample size as small as 130 is sufficient for identifying such batches with a statistical significance level of 0.01.https://ieeexplore.ieee.org/document/10736936/Recycled integrated circuitscounterfeit detectionhot carrier injection (HCI) |
| spellingShingle | Alexandros Dimopoulos Mihai Sima Stephen W. Neville A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling IEEE Open Journal of Circuits and Systems Recycled integrated circuits counterfeit detection hot carrier injection (HCI) |
| title | A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling |
| title_full | A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling |
| title_fullStr | A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling |
| title_full_unstemmed | A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling |
| title_short | A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling |
| title_sort | small tamper resistant anti recycling ic sensor with a reused i o interface and dc signalling |
| topic | Recycled integrated circuits counterfeit detection hot carrier injection (HCI) |
| url | https://ieeexplore.ieee.org/document/10736936/ |
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