The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior

The presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to un...

Full description

Saved in:
Bibliographic Details
Main Authors: Xianfang Gou, Xiaoyan Li, Shaoliang Wang, Hao Zhuang, Xixi Huang, Likai Jiang
Format: Article
Language:English
Published: Wiley 2018-01-01
Series:International Journal of Photoenergy
Online Access:http://dx.doi.org/10.1155/2018/4381579
Tags: Add Tag
No Tags, Be the first to tag this record!