Experimental Determination of Effective Minority Carrier Lifetime in HgCdTe Photovoltaic Detectors Using Optical and Electrical Methods

This paper presents experiment measurements of minority carrier lifetime using three different methods including modified open-circuit voltage decay (PIOCVD) method, small parallel resistance (SPR) method, and pulse recovery technique (PRT) on pn junction photodiode of the HgCdTe photodetector array...

Full description

Saved in:
Bibliographic Details
Main Authors: Haoyang Cui, Jialin Wang, Chaoqun Wang, Can Liu, Kaiyun Pi, Xiang Li, Yongpeng Xu, Zhong Tang
Format: Article
Language:English
Published: Wiley 2015-01-01
Series:Advances in Condensed Matter Physics
Online Access:http://dx.doi.org/10.1155/2015/482738
Tags: Add Tag
No Tags, Be the first to tag this record!