Symmetry Breaking as a Basis for Characterization of Dielectric Materials
This paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission line structure characterized by mirror/glide...
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MDPI AG
2025-01-01
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| Online Access: | https://www.mdpi.com/1424-8220/25/2/532 |
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| _version_ | 1832587496453570560 |
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| author | Dubravko Tomić Zvonimir Šipuš |
| author_facet | Dubravko Tomić Zvonimir Šipuš |
| author_sort | Dubravko Tomić |
| collection | DOAJ |
| description | This paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission line structure characterized by mirror/glide symmetry. The dielectric permittivity is deduced by measuring the transmission properties of such structure when presence of the dielectric material breaks the inherent symmetry of the structure and consequently introduce a stopband in propagation characteristic. To explore the influence of symmetry breaking on propagation properties, an analytical dispersion equation, for both symmetries, is formulated using the Rigorous Coupled Wave Analysis (RCWA) combined with the matrix transverse resonance condition. Based on the analytical equation, an optimization procedure and linearized model for a sensing structure is obtained, specifically for X-band characterization of FR4 substrates. The theoretical results of the model are validated with full wave simulations and experimentally. |
| format | Article |
| id | doaj-art-5bacd2d62d8f45009387e0d51c522ae9 |
| institution | Kabale University |
| issn | 1424-8220 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj-art-5bacd2d62d8f45009387e0d51c522ae92025-01-24T13:49:15ZengMDPI AGSensors1424-82202025-01-0125253210.3390/s25020532Symmetry Breaking as a Basis for Characterization of Dielectric MaterialsDubravko Tomić0Zvonimir Šipuš1University of Zagreb Faculty of Electrical Engineering and Computing, Unska 3, 10000 Zagreb, CroatiaUniversity of Zagreb Faculty of Electrical Engineering and Computing, Unska 3, 10000 Zagreb, CroatiaThis paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission line structure characterized by mirror/glide symmetry. The dielectric permittivity is deduced by measuring the transmission properties of such structure when presence of the dielectric material breaks the inherent symmetry of the structure and consequently introduce a stopband in propagation characteristic. To explore the influence of symmetry breaking on propagation properties, an analytical dispersion equation, for both symmetries, is formulated using the Rigorous Coupled Wave Analysis (RCWA) combined with the matrix transverse resonance condition. Based on the analytical equation, an optimization procedure and linearized model for a sensing structure is obtained, specifically for X-band characterization of FR4 substrates. The theoretical results of the model are validated with full wave simulations and experimentally.https://www.mdpi.com/1424-8220/25/2/532symmetry-breakingrigorous coupled wave analysisglide symmetrydielectric characterization |
| spellingShingle | Dubravko Tomić Zvonimir Šipuš Symmetry Breaking as a Basis for Characterization of Dielectric Materials Sensors symmetry-breaking rigorous coupled wave analysis glide symmetry dielectric characterization |
| title | Symmetry Breaking as a Basis for Characterization of Dielectric Materials |
| title_full | Symmetry Breaking as a Basis for Characterization of Dielectric Materials |
| title_fullStr | Symmetry Breaking as a Basis for Characterization of Dielectric Materials |
| title_full_unstemmed | Symmetry Breaking as a Basis for Characterization of Dielectric Materials |
| title_short | Symmetry Breaking as a Basis for Characterization of Dielectric Materials |
| title_sort | symmetry breaking as a basis for characterization of dielectric materials |
| topic | symmetry-breaking rigorous coupled wave analysis glide symmetry dielectric characterization |
| url | https://www.mdpi.com/1424-8220/25/2/532 |
| work_keys_str_mv | AT dubravkotomic symmetrybreakingasabasisforcharacterizationofdielectricmaterials AT zvonimirsipus symmetrybreakingasabasisforcharacterizationofdielectricmaterials |