Inverse Design of Metamaterial Absorbers for Far-Infrared CMOS Detectors
Far-infrared(FIR) technology, spanning the infrared (IR) to terahertz (THz) range, has been limited by the lack of high-sensitivity detectors. Here, a complementary metal-oxide–semiconductor (CMOS) microbolometer with Ti/Si3N4/SiO2/Al metamaterial absorbers (MAs) is designed for the detec...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11027144/ |
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