Far-Field Antenna Pattern Reconstruction Through Front and Back Planar Near-Field Scanning

This paper introduces a method for obtaining the far-field radiation pattern for all elevation angles through planar near-field measurements of both the front and back sides of an antenna under test (AUT). To obtain near-field measurement data for both the front and back sides of the AUT, sequential...

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Bibliographic Details
Main Authors: Jeong Yun Han, Dal-Jae Yun, Young Dam Kim
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10818475/
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