Four Level Simulation of MOSFET
In this paper a software (MOSOFT) has been developed for 4-level simulation of MOSFETS. This software simulates the device characteristics up to micron channel length and includes long channel, short channel, subthreshold and field dependent mobility degradation models.
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Main Authors: | M. N. Doja, Moinuddin, Umesh Kumar |
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Format: | Article |
Language: | English |
Published: |
Wiley
1998-01-01
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Series: | Active and Passive Electronic Components |
Subjects: | |
Online Access: | http://dx.doi.org/10.1155/1998/38280 |
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