Insights into the role of electrolytes in slurry performance for photoelectrochemical mechanical polishing of GaN wafers

Gallium Nitride (GaN) is the representative material among third-generation semiconductors. Due to its strong chemical stability, the chemical mechanical polishing (CMP) efficiency of GaN is extremely low. Photoelectrochemical mechanical polishing (PECMP) has proven effective for efficient, high-qua...

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Bibliographic Details
Main Authors: Yuewen Sun, Zhigang Dong, Jihao Zhang, Jiajian Feng, Renke Kang, Shang Gao
Format: Article
Language:English
Published: Elsevier 2025-05-01
Series:Journal of Materials Research and Technology
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Online Access:http://www.sciencedirect.com/science/article/pii/S223878542500777X
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