Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon
The temperature dependences of the electrical conductivity of porous silicon and thermally oxidized porous silicon in the modes of direct and alternating currents in the temperature range of 80-370 K are investigated. The results are analyzed within the model of disordered semiconductors and the mec...
Saved in:
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2014-01-01
|
| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04072.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850255550204346368 |
|---|---|
| author | I.B. Olenych |
| author_facet | I.B. Olenych |
| author_sort | I.B. Olenych |
| collection | DOAJ |
| description | The temperature dependences of the electrical conductivity of porous silicon and thermally oxidized porous silicon in the modes of direct and alternating currents in the temperature range of 80-370 K are investigated. The results are analyzed within the model of disordered semiconductors and the mechanisms of charge transfer are determined. Based on the spectra of thermally stimulated depolarization, the localized electron states which influence the electric transport properties of porous silicon are found. It is shown that thermal oxidation leads to the change in the occupation density of states in different energy ranges and expansion of the temperature range, in which hopping conductivity mechanism of porous silicon is realized. |
| format | Article |
| id | doaj-art-4224d1ea8c9a4e2abd2751b9c3173cb4 |
| institution | OA Journals |
| issn | 2077-6772 |
| language | English |
| publishDate | 2014-01-01 |
| publisher | Sumy State University |
| record_format | Article |
| series | Журнал нано- та електронної фізики |
| spelling | doaj-art-4224d1ea8c9a4e2abd2751b9c3173cb42025-08-20T01:56:52ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722014-01-015404072-104072-4Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous SiliconI.B. Olenych0Ivan Franko National University of Lviv, 50, Dragomanov Str., 79005 Lviv, UkraineThe temperature dependences of the electrical conductivity of porous silicon and thermally oxidized porous silicon in the modes of direct and alternating currents in the temperature range of 80-370 K are investigated. The results are analyzed within the model of disordered semiconductors and the mechanisms of charge transfer are determined. Based on the spectra of thermally stimulated depolarization, the localized electron states which influence the electric transport properties of porous silicon are found. It is shown that thermal oxidation leads to the change in the occupation density of states in different energy ranges and expansion of the temperature range, in which hopping conductivity mechanism of porous silicon is realized.http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04072.pdfPorous siliconThermal oxidationMechanisms of conductivityThermally Stimulated DepolarizationCharge trap |
| spellingShingle | I.B. Olenych Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon Журнал нано- та електронної фізики Porous silicon Thermal oxidation Mechanisms of conductivity Thermally Stimulated Depolarization Charge trap |
| title | Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon |
| title_full | Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon |
| title_fullStr | Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon |
| title_full_unstemmed | Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon |
| title_short | Influence of Thermal Oxidation on Processes of Charge Carrier Transfer in Porous Silicon |
| title_sort | influence of thermal oxidation on processes of charge carrier transfer in porous silicon |
| topic | Porous silicon Thermal oxidation Mechanisms of conductivity Thermally Stimulated Depolarization Charge trap |
| url | http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04072.pdf |
| work_keys_str_mv | AT ibolenych influenceofthermaloxidationonprocessesofchargecarriertransferinporoussilicon |