COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION
A measuring complex for quantitative analysis of element contents and distributions of doping atoms in subsurface layers of crystals as well as in thin films by means of the registration of energy spectra of ions scattered to angles higher than π/2 has been designed and fabricated. The complex const...
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| Format: | Article |
| Language: | English |
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Belarusian National Technical University
2015-04-01
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| Series: | Приборы и методы измерений |
| Online Access: | https://pimi.bntu.by/jour/article/view/177 |
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| author | A. S. Kamyshan F. F. Komarov V. V. Danilevich P. A. Grishan |
| author_facet | A. S. Kamyshan F. F. Komarov V. V. Danilevich P. A. Grishan |
| author_sort | A. S. Kamyshan |
| collection | DOAJ |
| description | A measuring complex for quantitative analysis of element contents and distributions of doping atoms in subsurface layers of crystals as well as in thin films by means of the registration of energy spectra of ions scattered to angles higher than π/2 has been designed and fabricated. The complex construction is based on a module-bloc principle. This complex includes microcontrollers which enables us to shorten elemental base of these devices. The measured energy resolution amounts to 1,3 %, energy width of one channel amounts to 281 eV, a range of registered energies amounts 37 to 281 keV, and method sensitivity amounts to 5x1014 at/cm2 . |
| format | Article |
| id | doaj-art-3e62edc0fa1746b9b74e7022553d62fe |
| institution | Kabale University |
| issn | 2220-9506 2414-0473 |
| language | English |
| publishDate | 2015-04-01 |
| publisher | Belarusian National Technical University |
| record_format | Article |
| series | Приборы и методы измерений |
| spelling | doaj-art-3e62edc0fa1746b9b74e7022553d62fe2025-02-03T11:37:42ZengBelarusian National Technical UniversityПриборы и методы измерений2220-95062414-04732015-04-01011722171COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTIONA. S. Kamyshan0F. F. Komarov1V. V. Danilevich2P. A. Grishan3A.N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State UniversityA.N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State UniversityA.N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State UniversityA.N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State UniversityA measuring complex for quantitative analysis of element contents and distributions of doping atoms in subsurface layers of crystals as well as in thin films by means of the registration of energy spectra of ions scattered to angles higher than π/2 has been designed and fabricated. The complex construction is based on a module-bloc principle. This complex includes microcontrollers which enables us to shorten elemental base of these devices. The measured energy resolution amounts to 1,3 %, energy width of one channel amounts to 281 eV, a range of registered energies amounts 37 to 281 keV, and method sensitivity amounts to 5x1014 at/cm2 .https://pimi.bntu.by/jour/article/view/177 |
| spellingShingle | A. S. Kamyshan F. F. Komarov V. V. Danilevich P. A. Grishan COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION Приборы и методы измерений |
| title | COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION |
| title_full | COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION |
| title_fullStr | COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION |
| title_full_unstemmed | COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION |
| title_short | COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION |
| title_sort | complex for elemental analysis of subsurface layers with nanometer depth resolution |
| url | https://pimi.bntu.by/jour/article/view/177 |
| work_keys_str_mv | AT askamyshan complexforelementalanalysisofsubsurfacelayerswithnanometerdepthresolution AT ffkomarov complexforelementalanalysisofsubsurfacelayerswithnanometerdepthresolution AT vvdanilevich complexforelementalanalysisofsubsurfacelayerswithnanometerdepthresolution AT pagrishan complexforelementalanalysisofsubsurfacelayerswithnanometerdepthresolution |