Scanning microwave impedance microscopy and its applications: A review

Scanning microwave impedance microscopy and its applications: A review

Scanning microwave impedance microscopy (sMIM) has become a powerful tool for nanoscale characterization, utilizing microwave frequencies to probe the material properties of diverse systems with remarkable spatial resolution. This review offers an in-depth analysis of the foundational principles, te...

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Bibliographic Details
Main Authors:	Diego Tami, Douglas A. A. Ohlberg, Cássio Gonçalves do Rego, Gilberto Medeiros-Ribeiro, Jhonattan C. Ramirez
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2025-01-01
Series:	APL Materials
Online Access:	http://dx.doi.org/10.1063/5.0241574
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