Scanning microwave impedance microscopy and its applications: A review
Scanning microwave impedance microscopy (sMIM) has become a powerful tool for nanoscale characterization, utilizing microwave frequencies to probe the material properties of diverse systems with remarkable spatial resolution. This review offers an in-depth analysis of the foundational principles, te...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2025-01-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/5.0241574 |
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