Effective Impedance Method for In situ Ellipsometry Analysis of Magnetic Films
The method of effective surface impedance is proposed and applied for in situ characterisation of magnetic structures. For any ellipsometry investigations a proper choice of a physical model is important for solving the inverse problem. Reasonable approximations used for in situ ellipsometry monitor...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2013-12-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04003.pdf |
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