Computation of Heterojunction Parameters at Low Temperatures in Heterojunctions Comprised of n-Type β-FeSi2 Thin Films and p-Type Si(111) Substrates Grown by Radio Frequency Magnetron Sputtering

In this study, n-type β-FeSi2/p-type Si heterojunctions, inside which n-type β-FeSi2 films were epitaxially grown on p-type Si(111) substrates, were created using radio frequency magnetron sputtering at a substrate temperature of 560°C and Ar pressure of 2.66×10-1 Pa. The heterojunctions were measur...

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Bibliographic Details
Main Authors: Phongsaphak Sittimart, Adison Nopparuchikun, Nathaporn Promros
Format: Article
Language:English
Published: Wiley 2017-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2017/6590606
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