The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing
The microstructural evolution and relaxation strengthening of nano-grained Ni annealed at a temperature range of 493–553 K were studied by in situ X-ray diffraction technique, transmission electron microscopy, and microhardness evaluation. Upon low-temperature annealing, the rather limited variatio...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
KeAi Communications Co., Ltd.
2024-12-01
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| Series: | Nano Materials Science |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2589965123000934 |
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