Data acquisition system for OLED defect detection and augmentation of system data through diffusion model
This paper presents a system and model for data acquisition and augmentation in OLED panel defect detection to improve detection efficiency. It addresses the challenges of data scarcity, data acquisition difficulties, and classification of different defect types. The proposed system acquires a hypot...
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| Format: | Article |
| Language: | English |
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Taylor & Francis Group
2025-01-01
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| Series: | Journal of Information Display |
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| Online Access: | https://www.tandfonline.com/doi/10.1080/15980316.2024.2381464 |
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| _version_ | 1832595602257477632 |
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| author | Byungjoon Kim Yongduek Seo |
| author_facet | Byungjoon Kim Yongduek Seo |
| author_sort | Byungjoon Kim |
| collection | DOAJ |
| description | This paper presents a system and model for data acquisition and augmentation in OLED panel defect detection to improve detection efficiency. It addresses the challenges of data scarcity, data acquisition difficulties, and classification of different defect types. The proposed system acquires a hypothetical base dataset and employs an image generation model for data augmentation. While image generation models have been instrumental in overcoming data scarcity, time and cost constraints in various fields, they still pose limitations in generating images with regular patterns and detecting defects within such data. Even when datasets are available, the precise definition and classification of different defect types becomes imperative. In this paper, we investigate the feasibility of using an image generation model to generate pattern images for OLED panel defect detection and apply it for data augmentation. In addition, we introduce an OLED panel defect data acquisition system, improve the limitations of data augmentation, and address the challenges of defect detection data augmentation using image generation models. |
| format | Article |
| id | doaj-art-34bc25ab9d144c8ba50394e9c90029ee |
| institution | Kabale University |
| issn | 1598-0316 2158-1606 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | Journal of Information Display |
| spelling | doaj-art-34bc25ab9d144c8ba50394e9c90029ee2025-01-18T14:43:36ZengTaylor & Francis GroupJournal of Information Display1598-03162158-16062025-01-01261576310.1080/15980316.2024.2381464Data acquisition system for OLED defect detection and augmentation of system data through diffusion modelByungjoon Kim0Yongduek Seo1Media Technology, Department of Art & Technology, Sogang University, Seoul, Republic of KoreaDepartment of Global Korean Studies, Loyola International College, Sogang University, Seoul, Republic of KoreaThis paper presents a system and model for data acquisition and augmentation in OLED panel defect detection to improve detection efficiency. It addresses the challenges of data scarcity, data acquisition difficulties, and classification of different defect types. The proposed system acquires a hypothetical base dataset and employs an image generation model for data augmentation. While image generation models have been instrumental in overcoming data scarcity, time and cost constraints in various fields, they still pose limitations in generating images with regular patterns and detecting defects within such data. Even when datasets are available, the precise definition and classification of different defect types becomes imperative. In this paper, we investigate the feasibility of using an image generation model to generate pattern images for OLED panel defect detection and apply it for data augmentation. In addition, we introduce an OLED panel defect data acquisition system, improve the limitations of data augmentation, and address the challenges of defect detection data augmentation using image generation models.https://www.tandfonline.com/doi/10.1080/15980316.2024.2381464Data acquisitiondata augmentationdefect detectionOLED defectsdiffusion model |
| spellingShingle | Byungjoon Kim Yongduek Seo Data acquisition system for OLED defect detection and augmentation of system data through diffusion model Journal of Information Display Data acquisition data augmentation defect detection OLED defects diffusion model |
| title | Data acquisition system for OLED defect detection and augmentation of system data through diffusion model |
| title_full | Data acquisition system for OLED defect detection and augmentation of system data through diffusion model |
| title_fullStr | Data acquisition system for OLED defect detection and augmentation of system data through diffusion model |
| title_full_unstemmed | Data acquisition system for OLED defect detection and augmentation of system data through diffusion model |
| title_short | Data acquisition system for OLED defect detection and augmentation of system data through diffusion model |
| title_sort | data acquisition system for oled defect detection and augmentation of system data through diffusion model |
| topic | Data acquisition data augmentation defect detection OLED defects diffusion model |
| url | https://www.tandfonline.com/doi/10.1080/15980316.2024.2381464 |
| work_keys_str_mv | AT byungjoonkim dataacquisitionsystemforoleddefectdetectionandaugmentationofsystemdatathroughdiffusionmodel AT yongduekseo dataacquisitionsystemforoleddefectdetectionandaugmentationofsystemdatathroughdiffusionmodel |