Data acquisition system for OLED defect detection and augmentation of system data through diffusion model

This paper presents a system and model for data acquisition and augmentation in OLED panel defect detection to improve detection efficiency. It addresses the challenges of data scarcity, data acquisition difficulties, and classification of different defect types. The proposed system acquires a hypot...

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Bibliographic Details
Main Authors: Byungjoon Kim, Yongduek Seo
Format: Article
Language:English
Published: Taylor & Francis Group 2025-01-01
Series:Journal of Information Display
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/15980316.2024.2381464
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