Kim, B., & Seo, Y. Data acquisition system for OLED defect detection and augmentation of system data through diffusion model. Taylor & Francis Group.
Chicago Style (17th ed.) CitationKim, Byungjoon, and Yongduek Seo. Data Acquisition System for OLED Defect Detection and Augmentation of System Data Through Diffusion Model. Taylor & Francis Group.
MLA (9th ed.) CitationKim, Byungjoon, and Yongduek Seo. Data Acquisition System for OLED Defect Detection and Augmentation of System Data Through Diffusion Model. Taylor & Francis Group.
Warning: These citations may not always be 100% accurate.