Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment
Transparent conductive oxides are essential materials for many optoelectronic applications. For new devices for aerospace and space applications, it is crucial to know how they respond to the space environment. The most important issue in commonly used low-Earth orbits is proton radiation. This stud...
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2025-01-01
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| author | Katarzyna Ungeheuer Janusz Rybak Amelia E. Bocirnea Denis A. Pikulski Aurelian C. Galca Konstanty W. Marszalek |
| author_facet | Katarzyna Ungeheuer Janusz Rybak Amelia E. Bocirnea Denis A. Pikulski Aurelian C. Galca Konstanty W. Marszalek |
| author_sort | Katarzyna Ungeheuer |
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| description | Transparent conductive oxides are essential materials for many optoelectronic applications. For new devices for aerospace and space applications, it is crucial to know how they respond to the space environment. The most important issue in commonly used low-Earth orbits is proton radiation. This study examines the effects of high-energy proton irradiation (226.5 MeV) on thin films of aluminium-doped zinc oxide (AZO) and indium tin oxide (ITO). We use X-ray diffraction and electron microscopy observations to see the changes in the structure and microstructure of the films. The optical properties and homogeneity of the materials are determined by spectrophotometry and spectroscopic ellipsometry (SE). Analysis of the chemical states of the elements with X-ray photoelectron spectroscopy (XPS) gives insight into what proton irradiation changes at the surface of the oxides. All measurements show that ITO is less influenced than AZO. The proton energy and fluence used in this study simulate about a hundred years in low Earth orbit. This research demonstrates that both transparent conductive oxide thin films can function under simulated space conditions, with ITO showing superior resilience. The ITO film was more homogenous in terms of the total thickness measured with SE, had fewer defects and adsorbates present on the surface, as XPS analysis proved, and did not show a difference after irradiation regarding its optical properties, transmission, refractive index, or extinction coefficient. |
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| institution | Kabale University |
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| publishDate | 2025-01-01 |
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| spelling | doaj-art-3450ed0003594fc3a3b2e72d00bd20a82025-01-24T13:20:42ZengMDPI AGApplied Sciences2076-34172025-01-0115275410.3390/app15020754Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space EnvironmentKatarzyna Ungeheuer0Janusz Rybak1Amelia E. Bocirnea2Denis A. Pikulski3Aurelian C. Galca4Konstanty W. Marszalek5Faculty of Computer Science, Electronics and Telecommunications, AGH University of Krakow, 30-059 Krakow, PolandFaculty of Computer Science, Electronics and Telecommunications, AGH University of Krakow, 30-059 Krakow, PolandNational Institute of Materials Physics, Atomistilor 405A, 077125 Magurele, Ilfov, RomaniaFaculty of Metal Engineering and Industrial Computer Science, AGH University of Krakow, 30-059 Krakow, PolandNational Institute of Materials Physics, Atomistilor 405A, 077125 Magurele, Ilfov, RomaniaFaculty of Computer Science, Electronics and Telecommunications, AGH University of Krakow, 30-059 Krakow, PolandTransparent conductive oxides are essential materials for many optoelectronic applications. For new devices for aerospace and space applications, it is crucial to know how they respond to the space environment. The most important issue in commonly used low-Earth orbits is proton radiation. This study examines the effects of high-energy proton irradiation (226.5 MeV) on thin films of aluminium-doped zinc oxide (AZO) and indium tin oxide (ITO). We use X-ray diffraction and electron microscopy observations to see the changes in the structure and microstructure of the films. The optical properties and homogeneity of the materials are determined by spectrophotometry and spectroscopic ellipsometry (SE). Analysis of the chemical states of the elements with X-ray photoelectron spectroscopy (XPS) gives insight into what proton irradiation changes at the surface of the oxides. All measurements show that ITO is less influenced than AZO. The proton energy and fluence used in this study simulate about a hundred years in low Earth orbit. This research demonstrates that both transparent conductive oxide thin films can function under simulated space conditions, with ITO showing superior resilience. The ITO film was more homogenous in terms of the total thickness measured with SE, had fewer defects and adsorbates present on the surface, as XPS analysis proved, and did not show a difference after irradiation regarding its optical properties, transmission, refractive index, or extinction coefficient.https://www.mdpi.com/2076-3417/15/2/754transparent conductive oxidesproton irradiationthin filmsspace application |
| spellingShingle | Katarzyna Ungeheuer Janusz Rybak Amelia E. Bocirnea Denis A. Pikulski Aurelian C. Galca Konstanty W. Marszalek Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment Applied Sciences transparent conductive oxides proton irradiation thin films space application |
| title | Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment |
| title_full | Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment |
| title_fullStr | Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment |
| title_full_unstemmed | Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment |
| title_short | Influence of Proton Irradiation on Thin Films of AZO and ITO Transparent Conductive Oxides—Simulation of Space Environment |
| title_sort | influence of proton irradiation on thin films of azo and ito transparent conductive oxides simulation of space environment |
| topic | transparent conductive oxides proton irradiation thin films space application |
| url | https://www.mdpi.com/2076-3417/15/2/754 |
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