Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Abstract Real-space, three-dimensional imaging of atomic structures in materials science is a critical yet challenging task. Although scanning transmission electron microscopy has achieved sub-angstrom lateral resolution through techniques like electron ptychography, depth resolution remains limited...

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Bibliographic Details
Main Authors: Zehao Dong, Yang Zhang, Chun-Chien Chiu, Sicheng Lu, Jianbing Zhang, Yu-Chen Liu, Suya Liu, Jan-Chi Yang, Pu Yu, Yayu Wang, Zhen Chen
Format: Article
Language:English
Published: Nature Portfolio 2025-01-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-025-56499-1
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