Scanless laser waveform measurement in the near-infrared
Field-resolved measurements of few-cycle laser waveforms allow access to ultrafast electron dynamics in light–matter interactions and are key to future lightwave electronics. Recently, sub-cycle gating based on nonlinear excitation in active pixel sensors has allowed the first single-shot measuremen...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2025-01-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0239294 |
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| _version_ | 1832542774400909312 |
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| author | Tran-Chau Truong Yangyang Liu Dipendra Khatri Yuxuan Zhang Bonggu Shim Michael Chini |
| author_facet | Tran-Chau Truong Yangyang Liu Dipendra Khatri Yuxuan Zhang Bonggu Shim Michael Chini |
| author_sort | Tran-Chau Truong |
| collection | DOAJ |
| description | Field-resolved measurements of few-cycle laser waveforms allow access to ultrafast electron dynamics in light–matter interactions and are key to future lightwave electronics. Recently, sub-cycle gating based on nonlinear excitation in active pixel sensors has allowed the first single-shot measurements of mid-infrared optical fields. Extending the techniques to shorter wavelengths, however, is not feasible using silicon-based detectors with bandgaps in the near-infrared. Here, we demonstrate an all-optical sampling technique for near-infrared laser fields, wherein an intense fundamental field generates a sub-cycle gate through nonlinear excitation of a wide-bandgap crystal, in this case, ZnO, which can sample the electric field of a weak perturbing pulse. By using a crossed-beam geometry, the temporal evolution of the perturbing field is mapped onto a transverse spatial axis of the nonlinear medium, and the waveform is captured in a single measurement of the spatially resolved fluorescence emission from the crystal. The technique is demonstrated through field-resolved measurements of the field reshaping during nonlinear propagation in the ZnO detection crystal. |
| format | Article |
| id | doaj-art-30a1d5475cbb4fba93d4fb63dfe5037d |
| institution | Kabale University |
| issn | 2378-0967 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | APL Photonics |
| spelling | doaj-art-30a1d5475cbb4fba93d4fb63dfe5037d2025-02-03T16:36:22ZengAIP Publishing LLCAPL Photonics2378-09672025-01-01101016101016101-710.1063/5.0239294Scanless laser waveform measurement in the near-infraredTran-Chau Truong0Yangyang Liu1Dipendra Khatri2Yuxuan Zhang3Bonggu Shim4Michael Chini5Department of Physics, University of Central Florida, Orlando, Florida 32816, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USADepartment of Physics, Applied Physics and Astronomy, Binghamton University, Binghamton, New York 13902, USADepartment of Physics, Applied Physics and Astronomy, Binghamton University, Binghamton, New York 13902, USADepartment of Physics, University of Central Florida, Orlando, Florida 32816, USAField-resolved measurements of few-cycle laser waveforms allow access to ultrafast electron dynamics in light–matter interactions and are key to future lightwave electronics. Recently, sub-cycle gating based on nonlinear excitation in active pixel sensors has allowed the first single-shot measurements of mid-infrared optical fields. Extending the techniques to shorter wavelengths, however, is not feasible using silicon-based detectors with bandgaps in the near-infrared. Here, we demonstrate an all-optical sampling technique for near-infrared laser fields, wherein an intense fundamental field generates a sub-cycle gate through nonlinear excitation of a wide-bandgap crystal, in this case, ZnO, which can sample the electric field of a weak perturbing pulse. By using a crossed-beam geometry, the temporal evolution of the perturbing field is mapped onto a transverse spatial axis of the nonlinear medium, and the waveform is captured in a single measurement of the spatially resolved fluorescence emission from the crystal. The technique is demonstrated through field-resolved measurements of the field reshaping during nonlinear propagation in the ZnO detection crystal.http://dx.doi.org/10.1063/5.0239294 |
| spellingShingle | Tran-Chau Truong Yangyang Liu Dipendra Khatri Yuxuan Zhang Bonggu Shim Michael Chini Scanless laser waveform measurement in the near-infrared APL Photonics |
| title | Scanless laser waveform measurement in the near-infrared |
| title_full | Scanless laser waveform measurement in the near-infrared |
| title_fullStr | Scanless laser waveform measurement in the near-infrared |
| title_full_unstemmed | Scanless laser waveform measurement in the near-infrared |
| title_short | Scanless laser waveform measurement in the near-infrared |
| title_sort | scanless laser waveform measurement in the near infrared |
| url | http://dx.doi.org/10.1063/5.0239294 |
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