Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy
It is a general belief in apertureless near-field microscopy that the so-called p-polarization configuration, where the incident light is polarized parallel to the axis of the probe, is advantageous to its counterpart, the s-polarization configuration, where the incident light is polarized perpendic...
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| Format: | Article |
| Language: | English |
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Wiley
2012-01-01
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| Series: | International Journal of Optics |
| Online Access: | http://dx.doi.org/10.1155/2012/962317 |
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| author | Yuika Saito Yoshiro Ohashi Prabhat Verma |
| author_facet | Yuika Saito Yoshiro Ohashi Prabhat Verma |
| author_sort | Yuika Saito |
| collection | DOAJ |
| description | It is a general belief in apertureless near-field microscopy that the so-called p-polarization configuration, where the incident light is polarized parallel to the axis of the probe, is advantageous to its counterpart, the s-polarization configuration, where the incident light is polarized perpendicular to the probe axis. While this is true for most samples under common near-field experimental conditions, there are samples which respond better to the s-polarization configuration due to their orientations. Indeed, there have been several reports that have discussed such samples. This leads us to an important requirement that the near-field experimental setup should be equipped with proper sensitivity for measurements with s-polarization configuration. This requires not only creation of effective s-polarized illumination at the near-field probe, but also proper enhancement of s-polarized light by the probe. In this paper, we have examined the s-polarization enhancement sensitivity of near-field probes by measuring and evaluating the near-field Rayleigh scattering images constructed by a variety of probes. We found that the s-polarization enhancement sensitivity strongly depends on the sharpness of the apex of near-field probes. We have discussed the efficient value of probe sharpness by considering a balance between the enhancement and the spatial resolution, both of which are essential requirements of apertureless near-field microscopy. |
| format | Article |
| id | doaj-art-23e3b3e653a64451bd45f21909e0e45d |
| institution | Kabale University |
| issn | 1687-9384 1687-9392 |
| language | English |
| publishDate | 2012-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Optics |
| spelling | doaj-art-23e3b3e653a64451bd45f21909e0e45d2025-02-03T01:22:36ZengWileyInternational Journal of Optics1687-93841687-93922012-01-01201210.1155/2012/962317962317Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical MicroscopyYuika Saito0Yoshiro Ohashi1Prabhat Verma2Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, JapanDepartment of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, JapanDepartment of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, JapanIt is a general belief in apertureless near-field microscopy that the so-called p-polarization configuration, where the incident light is polarized parallel to the axis of the probe, is advantageous to its counterpart, the s-polarization configuration, where the incident light is polarized perpendicular to the probe axis. While this is true for most samples under common near-field experimental conditions, there are samples which respond better to the s-polarization configuration due to their orientations. Indeed, there have been several reports that have discussed such samples. This leads us to an important requirement that the near-field experimental setup should be equipped with proper sensitivity for measurements with s-polarization configuration. This requires not only creation of effective s-polarized illumination at the near-field probe, but also proper enhancement of s-polarized light by the probe. In this paper, we have examined the s-polarization enhancement sensitivity of near-field probes by measuring and evaluating the near-field Rayleigh scattering images constructed by a variety of probes. We found that the s-polarization enhancement sensitivity strongly depends on the sharpness of the apex of near-field probes. We have discussed the efficient value of probe sharpness by considering a balance between the enhancement and the spatial resolution, both of which are essential requirements of apertureless near-field microscopy.http://dx.doi.org/10.1155/2012/962317 |
| spellingShingle | Yuika Saito Yoshiro Ohashi Prabhat Verma Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy International Journal of Optics |
| title | Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy |
| title_full | Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy |
| title_fullStr | Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy |
| title_full_unstemmed | Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy |
| title_short | Optimization of s-Polarization Sensitivity in Apertureless Near-Field Optical Microscopy |
| title_sort | optimization of s polarization sensitivity in apertureless near field optical microscopy |
| url | http://dx.doi.org/10.1155/2012/962317 |
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