Parent, S., Vachon, F., Gauthier, V., Lamoureux, S., Paquette, A., Deschamps, J., . . . Pratte, J. Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes. IEEE.
Chicago Style (17th ed.) CitationParent, Samuel, et al. Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes. IEEE.
MLA (9th ed.) CitationParent, Samuel, et al. Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes. IEEE.
Warning: These citations may not always be 100% accurate.