Mabasa, V., Chude‐Okonkwo, U. A. K., & Paul, B. S. Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products. Wiley.
Chicago Style (17th ed.) CitationMabasa, Vutivi, Uche A. K. Chude‐Okonkwo, and Babu S. Paul. Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products. Wiley.
MLA (9th ed.) CitationMabasa, Vutivi, et al. Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products. Wiley.
Warning: These citations may not always be 100% accurate.