Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products

Neural Topic Generation Utilizing Attention Mechanisms With Transformer‐Based Embeddings for Root‐Cause Analysis of Manufacturing Defects in Electronic Products

ABSTRACT Root‐cause analysis (RCA) is a critical process for identifying and mitigating manufacturing defects, particularly in the electronics industry, where minor issues can lead to significant operational and financial consequences. Traditional approaches to RCA, relying heavily on manual inspect...

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Bibliographic Details
Main Authors: Vutivi Mabasa, Uche A. K. Chude‐Okonkwo, Babu S. Paul
Format: Article
Language:English
Published: Wiley 2025-05-01
Series:Engineering Reports
Subjects:
attention mechanisms
BART
manufacturing defects
natural language processing
neural topic modeling
root‐cause analysis
Online Access:https://doi.org/10.1002/eng2.70191
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https://doi.org/10.1002/eng2.70191

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