Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films

Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films

We epitaxially grew rutile-structured VO _2 films with various out-of-plane lattice constants on (001) TiO _2 substrates by pulsed laser deposition and investigated their protonation by electrochemically injecting protons to the films in transistor structures with gate layers of proton conducting Na...

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Bibliographic Details
Main Authors: Sota Fuji, Yosuke Isoda, Xie Lingling, Mitsutaka Haruta, Takuya Majima, Yuichi Shimakawa, Daisuke Kan
Format: Article
Language:English
Published: IOP Publishing 2025-01-01
Series:Applied Physics Express
Subjects:
protonation
VO2
epitaxial films
lattice defects
Online Access:https://doi.org/10.35848/1882-0786/adc8f9
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