Mechanical Characterization of Reduced Graphene Oxide Using AFM
Nanoindentation coupled with Atomic Force Microscopy was used to study stiffness, hardness, and the reduced Young’s modulus of reduced graphene oxide. Oxygen reduction on the graphene oxide sample was performed via LightScribe DVD burner reduction, a cost-effective approach with potential for large...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Wiley
2019-01-01
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| Series: | Advances in Condensed Matter Physics |
| Online Access: | http://dx.doi.org/10.1155/2019/8713965 |
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| author | Alem Teklu Canyon Barry Matthew Palumbo Collin Weiwadel Narayanan Kuthirummal Jason Flagg |
| author_facet | Alem Teklu Canyon Barry Matthew Palumbo Collin Weiwadel Narayanan Kuthirummal Jason Flagg |
| author_sort | Alem Teklu |
| collection | DOAJ |
| description | Nanoindentation coupled with Atomic Force Microscopy was used to study stiffness, hardness, and the reduced Young’s modulus of reduced graphene oxide. Oxygen reduction on the graphene oxide sample was performed via LightScribe DVD burner reduction, a cost-effective approach with potential for large scale graphene production. The reduction of oxygen in the graphene oxide sample was estimated to about 10 percent using FTIR spectroscopic analysis. Images of the various samples were captured after each reduction cycle using Atomic Force Microscopy. Elastic and spectroscopic analyses were performed on the samples after each oxygen reduction cycle in the LightScribe, thus allowing for a comparison of stiffness, hardness, and the reduced Young’s modulus based on the number of reduction cycles. The highest values obtained were after the fifth and final reduction cycle, yielding a stiffness of 22.4 N/m, a hardness of 0.55 GPa, and a reduced Young’s modulus of 1.62 GPa as compared to a stiffness of 22.8 N/m, a hardness of 0.58 GPa, and a reduced Young’s modulus of 1.84 GPa for a commercially purchased graphene film made by CVD. This data was then compared to the expected values of pristine single layer graphene. Furthermore, two RC circuits were built, one using a parallel plate capacitors made of light scribed graphene on a kapton substrate (LSGC) and a second one using a CVD deposited graphene on aluminum (CVDGC). Their RC time constants and surface charge densities were compared. |
| format | Article |
| id | doaj-art-1707051faa6b43c9be70e9e23d523c2e |
| institution | Kabale University |
| issn | 1687-8108 1687-8124 |
| language | English |
| publishDate | 2019-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Advances in Condensed Matter Physics |
| spelling | doaj-art-1707051faa6b43c9be70e9e23d523c2e2025-02-03T06:05:09ZengWileyAdvances in Condensed Matter Physics1687-81081687-81242019-01-01201910.1155/2019/87139658713965Mechanical Characterization of Reduced Graphene Oxide Using AFMAlem Teklu0Canyon Barry1Matthew Palumbo2Collin Weiwadel3Narayanan Kuthirummal4Jason Flagg5Department of Physics and Astronomy, College of Charleston, Charleston, SC, USADepartment of Physics and Astronomy, College of Charleston, Charleston, SC, USADepartment of Physics and Astronomy, College of Charleston, Charleston, SC, USADepartment of Physics and Astronomy, College of Charleston, Charleston, SC, USADepartment of Physics and Astronomy, College of Charleston, Charleston, SC, USADepartment of Physics and Astronomy, College of Charleston, Charleston, SC, USANanoindentation coupled with Atomic Force Microscopy was used to study stiffness, hardness, and the reduced Young’s modulus of reduced graphene oxide. Oxygen reduction on the graphene oxide sample was performed via LightScribe DVD burner reduction, a cost-effective approach with potential for large scale graphene production. The reduction of oxygen in the graphene oxide sample was estimated to about 10 percent using FTIR spectroscopic analysis. Images of the various samples were captured after each reduction cycle using Atomic Force Microscopy. Elastic and spectroscopic analyses were performed on the samples after each oxygen reduction cycle in the LightScribe, thus allowing for a comparison of stiffness, hardness, and the reduced Young’s modulus based on the number of reduction cycles. The highest values obtained were after the fifth and final reduction cycle, yielding a stiffness of 22.4 N/m, a hardness of 0.55 GPa, and a reduced Young’s modulus of 1.62 GPa as compared to a stiffness of 22.8 N/m, a hardness of 0.58 GPa, and a reduced Young’s modulus of 1.84 GPa for a commercially purchased graphene film made by CVD. This data was then compared to the expected values of pristine single layer graphene. Furthermore, two RC circuits were built, one using a parallel plate capacitors made of light scribed graphene on a kapton substrate (LSGC) and a second one using a CVD deposited graphene on aluminum (CVDGC). Their RC time constants and surface charge densities were compared.http://dx.doi.org/10.1155/2019/8713965 |
| spellingShingle | Alem Teklu Canyon Barry Matthew Palumbo Collin Weiwadel Narayanan Kuthirummal Jason Flagg Mechanical Characterization of Reduced Graphene Oxide Using AFM Advances in Condensed Matter Physics |
| title | Mechanical Characterization of Reduced Graphene Oxide Using AFM |
| title_full | Mechanical Characterization of Reduced Graphene Oxide Using AFM |
| title_fullStr | Mechanical Characterization of Reduced Graphene Oxide Using AFM |
| title_full_unstemmed | Mechanical Characterization of Reduced Graphene Oxide Using AFM |
| title_short | Mechanical Characterization of Reduced Graphene Oxide Using AFM |
| title_sort | mechanical characterization of reduced graphene oxide using afm |
| url | http://dx.doi.org/10.1155/2019/8713965 |
| work_keys_str_mv | AT alemteklu mechanicalcharacterizationofreducedgrapheneoxideusingafm AT canyonbarry mechanicalcharacterizationofreducedgrapheneoxideusingafm AT matthewpalumbo mechanicalcharacterizationofreducedgrapheneoxideusingafm AT collinweiwadel mechanicalcharacterizationofreducedgrapheneoxideusingafm AT narayanankuthirummal mechanicalcharacterizationofreducedgrapheneoxideusingafm AT jasonflagg mechanicalcharacterizationofreducedgrapheneoxideusingafm |