Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films

Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films

This paper outlines the design and fabrication of a portable optomechatronic system based on the theta-2theta configuration, which explores various optical characterization techniques for transparent materials and dielectric thin films. These techniques include Brewster angle and Abelès-Brewster ang...

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Bibliographic Details
Main Authors: Araceli Sánchez-Alvarez, Osvaldo Rodríguez-Quiroz, Gabriela Elizabeth Quintanilla-Villanueva, Melissa Marlene Rodríguez-Delgado, Juan Francisco Villarreal-Chiu, Oscar Javier Silva-Hernández, Donato Luna-Moreno
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Optics
Subjects:
surface plasmon resonance
thin film
refractive index
optical sensor
optical instrumentation
Online Access:https://www.mdpi.com/2673-3269/5/4/44
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