Software Defect Prediction Using Deep Q-Learning Network-Based Feature Extraction

Software Defect Prediction Using Deep Q-Learning Network-Based Feature Extraction

Machine learning-based software defect prediction (SDP) approaches have been commonly proposed to help to deliver high-quality software. Unfortunately, all the previous research conducted without effective feature reduction suffers from high-dimensional data, leading to unsatisfactory prediction per...

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Bibliographic Details
Main Authors: Qinhe Zhang, Jiachen Zhang, Tie Feng, Jialang Xue, Xinxin Zhu, Ningyang Zhu, Zhiheng Li
Format: Article
Language:English
Published: Wiley 2024-01-01
Series:IET Software
Online Access:http://dx.doi.org/10.1049/2024/3946655
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http://dx.doi.org/10.1049/2024/3946655

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