A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power

Performance optimization is a crucial aspect of enhancing the efficiency of electronic systems, and scaling is a primary method for achieving optimal performance while maintaining the integrity of system architecture. This paper introduces a novel algorithm for optimizing transistor sizing in static...

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Main Authors: Sanket M. Mantrashetti, Arunkumar P Chavan, Prakash Pawar, H. V. Ravish Aradhya, Omkar S. Powar
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
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Online Access:https://ieeexplore.ieee.org/document/10833602/
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author Sanket M. Mantrashetti
Arunkumar P Chavan
Prakash Pawar
H. V. Ravish Aradhya
Omkar S. Powar
author_facet Sanket M. Mantrashetti
Arunkumar P Chavan
Prakash Pawar
H. V. Ravish Aradhya
Omkar S. Powar
author_sort Sanket M. Mantrashetti
collection DOAJ
description Performance optimization is a crucial aspect of enhancing the efficiency of electronic systems, and scaling is a primary method for achieving optimal performance while maintaining the integrity of system architecture. This paper introduces a novel algorithm for optimizing transistor sizing in static random-access memory (SRAM) to enhance speed, improve Static Noise Margin (SNM), and reduce leakage power consumption. The SRAM is designed using 45 nm technology and operates at a supply voltage of 1.2 V. To validate the algorithm&#x2019;s effectiveness, Monte Carlo simulations were conducted under varying process, voltage, and temperature conditions. The results demonstrate read access times of 11.17 ps (HIGH) and 9.97 ps (LOW), and write access times of 12.00 ps (HIGH) and 17.00 ps (LOW). The measured SNM values for the read, write, and hold states were 328.2 mV, 453.7 mV, and 452.3 mV, respectively. The inclusion of precharge and write driver circuits allows for a compact SRAM layout, occupying <inline-formula> <tex-math notation="LaTeX">$9.79~\mu $ </tex-math></inline-formula> m<sup>2</sup>, with the SRAM cell itself occupying <inline-formula> <tex-math notation="LaTeX">$4.1~\mu $ </tex-math></inline-formula> m<sup>2</sup>. Furthermore, the proposed SRAM design exhibits low leakage power consumption of 1.64 pW, demonstrating the efficiency and performance benefits of the optimized transistor sizing approach.
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spelling doaj-art-0fcca4f27e1a4d1fb5acf77cf535309a2025-01-21T00:01:27ZengIEEEIEEE Access2169-35362025-01-01139942995410.1109/ACCESS.2025.352733310833602A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage PowerSanket M. Mantrashetti0https://orcid.org/0009-0000-3961-2029Arunkumar P Chavan1https://orcid.org/0000-0001-8056-8795Prakash Pawar2H. V. Ravish Aradhya3Omkar S. Powar4https://orcid.org/0000-0003-4646-8787Department of Electronics and Communication Engineering, R. V. College of Engineering, Bengaluru, IndiaMMRFIC Technology Pvt Ltd., Bengaluru, IndiaDepartment of Electronics and Communication Engineering, Indian Institute of Information Technology Dharwad, Dharwad, IndiaDepartment of Electronics and Communication Engineering, R. V. College of Engineering, Bengaluru, IndiaDepartment of Biomedical Engineering, Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, Karnataka, IndiaPerformance optimization is a crucial aspect of enhancing the efficiency of electronic systems, and scaling is a primary method for achieving optimal performance while maintaining the integrity of system architecture. This paper introduces a novel algorithm for optimizing transistor sizing in static random-access memory (SRAM) to enhance speed, improve Static Noise Margin (SNM), and reduce leakage power consumption. The SRAM is designed using 45 nm technology and operates at a supply voltage of 1.2 V. To validate the algorithm&#x2019;s effectiveness, Monte Carlo simulations were conducted under varying process, voltage, and temperature conditions. The results demonstrate read access times of 11.17 ps (HIGH) and 9.97 ps (LOW), and write access times of 12.00 ps (HIGH) and 17.00 ps (LOW). The measured SNM values for the read, write, and hold states were 328.2 mV, 453.7 mV, and 452.3 mV, respectively. The inclusion of precharge and write driver circuits allows for a compact SRAM layout, occupying <inline-formula> <tex-math notation="LaTeX">$9.79~\mu $ </tex-math></inline-formula> m<sup>2</sup>, with the SRAM cell itself occupying <inline-formula> <tex-math notation="LaTeX">$4.1~\mu $ </tex-math></inline-formula> m<sup>2</sup>. Furthermore, the proposed SRAM design exhibits low leakage power consumption of 1.64 pW, demonstrating the efficiency and performance benefits of the optimized transistor sizing approach.https://ieeexplore.ieee.org/document/10833602/Area efficientdesign optimizationleakage currentlow latencyMonte Carlo analysispower efficient
spellingShingle Sanket M. Mantrashetti
Arunkumar P Chavan
Prakash Pawar
H. V. Ravish Aradhya
Omkar S. Powar
A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
IEEE Access
Area efficient
design optimization
leakage current
low latency
Monte Carlo analysis
power efficient
title A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
title_full A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
title_fullStr A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
title_full_unstemmed A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
title_short A Novel Algorithm for Aspect Ratio Estimation in SRAM Design to Achieve High SNM, High Speed, and Low Leakage Power
title_sort novel algorithm for aspect ratio estimation in sram design to achieve high snm high speed and low leakage power
topic Area efficient
design optimization
leakage current
low latency
Monte Carlo analysis
power efficient
url https://ieeexplore.ieee.org/document/10833602/
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