Using secondary electron electron beam induced current for characterization of nanoparticle morphologies
Saved in:
| Main Authors: | Vlasov Evgenii, Heyvaert Wouter, Girod Robin, Liz-Marzán Luis M., Verbeeck Johan, Bals Sara |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2024-01-01
|
| Series: | BIO Web of Conferences |
| Subjects: | |
| Online Access: | https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_02002.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Quantification of chirality from electron tomography data
by: Girod Robin, et al.
Published: (2024-01-01) -
Femtosecond electron beam probe of ultrafast electronics
by: Mattes Maximilian, et al.
Published: (2024-01-01) -
Electron Beams at Europa
by: F. Allegrini, et al.
Published: (2024-07-01) -
Atomic Fabrication of 2D Materials Using Electron Beams Inside an Electron Microscope
by: Mingrui Zhou, et al.
Published: (2024-10-01) -
Atom Probe Tomography experiments performed in a (Scanning) Transmission Electron Microscope
by: Lefebvre Williams, et al.
Published: (2024-01-01)