Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity

The Open Circuit Voltage Decay (OCVD) method for the determination of the base minority carrier lifetime (τ ) and the back surface recombination velocity (S) of silicon solar cells has been investigated at constant illumination level. The validity of the method has been discussed through a simulatio...

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Bibliographic Details
Main Authors: B. Affour, P. Mialhe
Format: Article
Language:English
Published: Wiley 1997-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/1997/46342
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