High-resolution correlative imaging in ultrafast electron microscopy by Ye-Jin Kim, Won-Woo Park, Hak-Won Nho, Oh-Hoon Kwon

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Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid by Johannes Möller, Michele Caresana, Alexander Schottelius, Felix Lehmkühler, Ulrike Boesenberg, Frédéric Caupin, Francesco Dallari, Tiberio A. Ezquerra, José M. Fernández, Luca Gelisio, Claudia Goy, Jörg Hallmann, Anton Kalinin, Chan Kim, Ruslan P. Kurta, Dmitry Lapkin, Francesco Mambretti, Markus Scholz, Roman Shayduk, René Steinbrügge, Florian Trinter, Ivan A. Vartanyants, Alexey Zozulya, Davide E. Galli, Gerhard Grübel, Anders Madsen, Robert E. Grisenti

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Small but mighty: the power of microcrystals in structural biology by Courtney J. Tremlett, Jack Stubbs, William S. Stuart, Patrick D. Shaw Stewart, Jonathan West, Allen M. Orville, Ivo Tews, Nicholas J. Harmer

“…Additionally, we examine sample-delivery methods, which are crucial for selecting appropriate crystallization strategies. Establishing reliable protocols for sample preparation and delivery opens new avenues for macromolecular crystallography, particularly in the rapidly progressing field of time-resolved crystallography.…”
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MYTHEN III: advancements in single photon counting detectors for synchrotron powder diffraction experiments by Marie Andrä, Anna Bergamaschi, Filippo Baruffaldi, Martin Brückner, Maria Carulla, Nicola Casati, Antonio Cervellino, Roberto Dinapoli, Erik Fröjdh, Dominic Greiffenberg, Shqipe Hasanaj, Julian Heymes, Viktoria Hinger, Pawel Kozlowski, Carlos Lopez Cuenca, Dominik Meister, Davide Mezza, Konstantinos Moustakas, Aldo Mozzanica, Kirsty Paton, Christian Ruder, Valerio Scagnoli, Grigory Smolentsev, Bernd Schmitt, Dhanya Thattil, Xiangyu Xie, Jiaguo Zhang

“…The single photon counting microstrip detector MYTHEN III was developed at the Paul Scherrer Institute to satisfy the increasing demands in detector performance of synchrotron radiation experiments, focusing on time-resolved and on-edge powder diffraction measurements. …”
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Development of 6-inch h-BN thick wafers by Z. Alemoush, M. Almohammad, J. Li, J. Y. Lin, H. X. Jiang

“…Analysis through x-ray diffraction, selected area electron diffraction, and transmission electron microscopy revealed that the wafer deposited at the lowest pressure of 20 Torr exhibited highest crystalline quality with measured c-lattice constant c = 6.66 Å and an a-lattice constant a = 2.48 Å, in good agreement with the expected lattice parameters of phase-pure h-BN. …”
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