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    Effects of Gate Stack Structural and Process Defectivity on High-k Dielectric Dependence of NBTI Reliability in 32 nm Technology Node PMOSFETs by H. Hussin, N. Soin, M. F. Bukhori, S. Wan Muhamad Hatta, Y. Abdul Wahab

    Published 2014-01-01
    “…The results suggest that the degradations are highly dependent on the physical gate stack parameters for a given stress voltage and temperature. …”
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    Engagement factors affect academic success through study approaches among physical education and sport university students: a mediation analysis by Amayra Tannoubi, Amayra Tannoubi, Tore Bonsaksen, Tore Bonsaksen, Gry Mørk, Farruh Ahmedov, Edi Setiawan, Fairouz Azaiez

    Published 2025-02-01
    “…The study aimed to investigate how emotional, cognitive, and behavioral engagement affect academic success through study approaches among physical education and sports students.MethodsOnline forms were submitted by 488 students in physical education and sports (age range 19–25 years, Mean = 21 ± 1.5 year). …”
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