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    High-energy dual-energy computed tomography for the characterization of large and thick objects by Alix Sardet, Daniel Eck, Nicolas Estre, Frédéric Moutet, Emmanuel Payan, Cécilia Tarpau

    Published 2025-02-01
    “…Therfore, this work focuses on extending the first technique to high energies, as it does not require any assumptions on the materials to be detected and takes into account beam-hardening effects through the system spectral response.  …”
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    A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL) by Pedram Aridas, Narendra Kumar, Anis Salwa Mohd Khairuddin, Daniel Ting, Vivek Regeev

    Published 2025-01-01
    “…The algorithm, which incorporates domain knowledge in creating a graph representation of wafer, and utilizing a weighted edge label propagation model, has demonstrated its effectiveness by achieving a 68% accuracy on a real-world dataset, offering a promising approach to enhance quality control in semiconductor manufacturing.…”
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