Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling by Chanwoo Park, Hyunbo Cho, Jungwoo Lee

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Physics-Based Compact Model of Independent Dual-Gate BEOL-Transistors for Reliable Capacitorless Memory by Lihua Xu, Kaifei Chen, Zhi Li, Yue Zhao, Lingfei Wang, Ling Li

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Robust Model-Based Reliability Approach to Tackle Shilling Attacks in Collaborative Filtering Recommender Systems by Santiago Alonso, Jesus Bobadilla, Fernando Ortega, Ricardo Moya

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A Design of a Redundancy-Based Cascaded Bidirectional DC–DC Converter for Improved Reliability in Energy Storage Devices by Thales Augusto Fagundes, Guilherme Henrique Favaro Fuzato, Rafael Fernando Quirino Magossi, Ana Lais Rui Oliveira, Ricardo Quadros Machado

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Enhancing Power Grid Reliability With Machine Learning and Auxiliary Classifier Generative Adversarial Networks: A Study on Fault Detection Using the Georgia Electric System Load D... by Hafeez Ur Rehman Siddiqui, Robert Brown, Adil Ali Saleem, Muhammad Amjad Raza, Sandra Dudley

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Channel Mobility and Inversion Carrier Density in MFIS FEFET: Deep Insights Into Device Physics for Non-Volatile Memory Applications by Song-Hyeon Kuk, Kyul Ko, Bong Ho Kim, Joon Pyo Kim, Jae-Hoon Han, Sang-Hyeon Kim

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Improving Accuracy and Calibration of Deep Image Classifiers With Agreement-Driven Dynamic Ensemble by Pedro Conde, Rui L. Lopes, Cristiano Premebida

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Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors by Xhesila Xhafa, Ali Dogus Gungordu, Mustafa Berke Yelten

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Mixed Redundancy Strategy for Modular Multilevel Converters in High-Power Applications by Miad Ahmadi, Aditya Shekhar, Pavol Bauer

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An Online Monitoring Method for Bond Wire Fatigue in IGBT Module by Hongtao Liu, Fei Wang, Xiaokang Zhang, Weiyi Xia, Lintao Ren

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Performance Enhancement of Indium Zinc Oxide Thin-Film Transistors Through Process Optimizations by Mingjun Zhang, Jinyang Huang, Zihan Wang, Paramasivam Balasubramanian, Yan Yan, Ye Zhou, Su-Ting Han, Lei Lu, Meng Zhang

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Low-Temperature Deuterium Annealing for HfO₂/SiO₂ Gate Dielectric in Silicon MOSFETs by Tae-Hyun Kil, Ju-Won Yeon, Hyo-Jun Park, Moon-Kwon Lee, Eui-Cheol Yun, Min-Woo Kim, Sang-Min Kang, Jun-Young Park

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Fast-Read Storage Performance by Thyristor Operation in 3-D Flash Memory by Tomoya Sanuki, Hideto Horii, Takashi Maeda

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Quantum Long Short-Term Memory-Assisted Optimization for Efficient Vehicle Platooning in Connected and Autonomous Systems by Mahzabeen Emu, Taufiq Rahman, Salimur Choudhury, Kai Salomaa

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Revolutionizing User Authentication Exploiting Explainable AI and CTGAN-Based Keystroke Dynamics by Hussien Abdel Raouf, Mostafa M. Fouda, Mohamed I. Ibrahem

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ALBERTA: ALgorithm-Based Error Resilience in Transformer Architectures by Haoxuan Liu, Vasu Singh, Michal Filipiuk, Siva Kumar Sastry Hari

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UVtrack: Multi-Modal Indoor Seamless Localization Using Ultra-Wideband Communication and Vision Sensors by Yi Xu, Zhigang Chen, Ming Zhao, Fengxiao Tang, Yangfan Li, Jiaqi Liu, Nei Kato

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Channel Coding Toward 6G: Technical Overview and Outlook by Mohammad Rowshan, Min Qiu, Yixuan Xie, Xinyi Gu, Jinhong Yuan

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Mechanism of Threshold Voltage Instability in Double Gate α-IGZO Nanosheet TFT Under Bias and Temperature Stress by Muhammad Aslam, Shu-Wei Chang, Yi-Ho Chen, Yao-Jen Lee, Yiming Li, Wen-Hsi Lee

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The Effect of Ferroelectric/Dielectric Capacitance Ratio on Short-Term Retention Characteristics of MFMIS FeFET by Junghyeon Hwang, Giuk Kim, Hongrae Joh, Jinho Ahn, Sanghun Jeon

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