Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling by Chanwoo Park, Hyunbo Cho, Jungwoo Lee

“…IEEE Journal of the Electron Devices Society…”
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Device Modeling Based on Cost-Sensitive Densely Connected Deep Neural Networks by Xiaoying Tang, Zhiqiang Li, Lang Zeng, Hongwei Zhou, Xiaoxu Cheng, Zhenjie Yao

“…IEEE Journal of the Electron Devices Society…”
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Stability of GaN HEMT Device Under Static and Dynamic Gate Stress by Linfei Gao, Ze Zhong, Qiyan Zhang, Xiaohua Li, Xinbo Xiong, Shaojun Chen, Longkou Chen, Huaibao Yan, Anle Zhang, Jiajun Han, Wenrong Zhuang, Feng Qiu, Hsien-Chin Chiu, Shuangwu Huang, Xinke Liu

“…IEEE Journal of the Electron Devices Society…”
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High Speed Level-Down Shifter Using LTPO TFTs for Low Power and Interface Electronics by Sunaina Priyadarshi, Abidur Rahaman, Mohammad Masum Billah, Sabiqun Nahar, Md. Redowan Mahmud Arnob, Jin Jang

“…IEEE Journal of the Electron Devices Society…”
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Charge-Based Compact Modeling of OECTs for Neuromorphic Applications by Ghader Darbandy, Malte Koch, Lukas M. Bongartz, Karl Leo, Hans Kleemann, Alexander Kloes

“…IEEE Journal of the Electron Devices Society…”
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Channel Mobility and Inversion Carrier Density in MFIS FEFET: Deep Insights Into Device Physics for Non-Volatile Memory Applications by Song-Hyeon Kuk, Kyul Ko, Bong Ho Kim, Joon Pyo Kim, Jae-Hoon Han, Sang-Hyeon Kim

“…IEEE Journal of the Electron Devices Society…”
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Pests Phototactic Rhythm Driven Solar Insecticidal Lamp Device Evolution: Mathematical Model Preliminary Result and Future Directions by Heyang Yao, Lei Shu, Wei Lin, Kai Huang, Miguel Martinez-Garcia, Xiuguo Zou

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Experimental Comparison of HfO_2/X-Based ReRAM Devices Switching Properties by the MIM Capacitance by Fernando Jose da Costa, Aseel Zeinati, Renan Trevisoli, Durga Misra, Rodrigo Trevisoli Doria

“…IEEE Journal of the Electron Devices Society…”
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High-Performance Carbon Nanotube Optoelectronic Transistor With Optimized Process for 3D Communication Circuit Applications by Shuang Liu, Heyi Huang, Yanqing Li, Yadong Zhang, Feixiong Wang, Zhaohao Zhang, Qingzhu Zhang, Jiali Huo, Jiaxin Yao, Jing Wen, Huaxiang Yin

“…IEEE Journal of the Electron Devices Society…”
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Enhancement and Expansion of the Neural Network-Based Compact Model Using a Binning Method by Jinyoung Choi, Hyunjoon Jeong, Sangmin Woo, Hyungmin Cho, Yohan Kim, Jeong-Taek Kong, Soyoung Kim

“…IEEE Journal of the Electron Devices Society…”
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A Design of a Redundancy-Based Cascaded Bidirectional DC–DC Converter for Improved Reliability in Energy Storage Devices by Thales Augusto Fagundes, Guilherme Henrique Favaro Fuzato, Rafael Fernando Quirino Magossi, Ana Lais Rui Oliveira, Ricardo Quadros Machado

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Challenges and Innovations in CMOS-Based 300-GHz Transceivers for High-Speed Wireless Communication by Minoru Fujishima

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A Versatile Switched-Mode Large-Signal GaN-Based Low-Distortion Arbitrary Waveform Generator by Ignacio Alvarez-Gariburo, Hector Sarnago, Jose M. Burdio, Oscar Lucia

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Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S₂₂ and h₂₁: An Effective Machine Learning Approach by Zegen Zhu, Gianni Bosi, Antonio Raffo, Giovanni Crupi, Jialin Cai

“…IEEE Journal of the Electron Devices Society…”
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Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS by Gerd Kiene, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, Fabio Sebastiano

“…IEEE Journal of the Electron Devices Society…”
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An Approach to Determine Noise Model Parameter for Submicron MOSFET from RF Noise Figure Measurement by Hanqi Gao, Jing Jin, Jianjun Zhou

“…IEEE Journal of the Electron Devices Society…”
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Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise by Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli

“…IEEE Journal of the Electron Devices Society…”
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The Effect of Ferroelectric/Dielectric Capacitance Ratio on Short-Term Retention Characteristics of MFMIS FeFET by Junghyeon Hwang, Giuk Kim, Hongrae Joh, Jinho Ahn, Sanghun Jeon

“…IEEE Journal of the Electron Devices Society…”
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Conductivity Enhancement of PVD-WS₂ Films Using Cl₂-Plasma Treatment Followed by Sulfur-Vapor Annealing by Keita Kurohara, Shinya Imai, Takuya Hamada, Tetsuya Tatsumi, Shigetaka Tomiya, Kuniyuki Kakushima, Kazuo Tsutsui, Hitoshi Wakabayashi

“…IEEE Journal of the Electron Devices Society…”
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Investigation of Static Performances of 1.2kV 4H-SiC MOSFETs Fabricated Using All ‘Room Temperature’ Ion Implantations by Stephen A. Mancini, Seung Yup Jang, Zeyu Chen, Dongyoung Kim, Alex Bialy, Balaji Raghotamacher, Michael Dudley, Nadeemullah Mahadik, Robert Stahlbush, Mowafak Al-Jassim, Woongje Sung

“…IEEE Journal of the Electron Devices Society…”
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