Electron Spin Resonance and Atomic Force Microscopy Study on Gadolinium Doped Ceria by Cesare Oliva, Francesco Orsini, Serena Cappelli, Paolo Arosio, Mattia Allieta, Mauro Coduri, Marco Scavini

“…A combined electron spin resonance (ESR) and atomic force microscopy (AFM) study on Ce1−xGdxO2−x/2 samples is here presented, aimed at investigating the evolution of the ESR spectral shape as a function of x in a wide composition range. …”
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Many-body van der Waals interactions in multilayer structures studied by atomic force microscopy by Xiao Wang, Zepu Kou, Ruixi Qiao, Yuyang Long, Baowen Li, Xuemei Li, Wanlin Guo, Xiaofei Liu, Jun Yin

“…Here we verify the substrate contribution at the adhesion between the atomic force microscopy tip and the supported graphene, by taking advantage of the atomic-scale proximity of two objects separated by graphene. …”
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Noise and Electrical Oscillations Generation during the Investigation of the Resistive Switching in the Yttria Stabilized Zirconia Films by Conductive Atomic Force Microscopy by Oleg Gorshkov, Dmitry Filatov, Dmitry Antonov, Ivan Antonov

“…The effect of resistive switching in the yttria stabilized zirconia (YSZ) thin films on Si substrates has been studied by Conductive Atomic Force Microscopy (CAFM). The resistive switching of the YSZ films from the low conductive state to the highly conductive one has been found to be associated with the increasing of the noise with broad frequency spectrum related to the redistribution of the oxygen vacancies in YSZ. …”
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Morphological and multifractal studies of nanocrystalline Au films by Mehrdad Ahmadi, Maryam Nasehnejad

“…In this study, we investigated the surface morphology of Au coatings using atomic force microscopy (AFM). we aimed to understand the growth mechanisms and control the nano- and micro-structure of the films to achieve desired morphological properties. …”
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Formation on quartz substrate and study of properties of nanostructured layers from polyvinylen obtained by dehydrochlorination of polyvinyl chloride with modifying additive — iron... by O. V. Krivozubov, Yu. G. Kryazhev, I. V. Anikeeva, N. A. Davletkildeev, D. V. Sokolov, O. N. Semenova

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Empirical Correlation of the Morphology of Coiled Carbon Nanotubes with Their Response to Axial Compression by Jabulani R. Barber, Jeffrey S. Boyles, Aldo A. Ferri, Lawrence A. Bottomley

“…Characteristic features in the thermal resonance spectrum and in the force and oscillation amplitude curves for each of these responses to induced stress are presented. …”
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Study of Molecular Interactions, Optical, and Structural Properties through the Green Synthesis of Selenium Oxide Nanoparticles from Hibiscus sabdarriffal: Biocompatibility for Bio... by Ali Bahari, Saad I. Esmail, Ashraf M. Alattar

“…Researchers have analyzed the antibacterial properties and nanostructure characteristics of selenium oxide nanocrystallites using various techniques methods, such as imaging microscopy, scanning electron microscopy, ultraviolet‒visible spectroscopy (UV‒VIS), transmission electron microscopy, atomic force microscopy, and X-ray diffraction (XRD) spectroscopy. …”
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Study of the Effect of TiO2 Layer on the Adsorption and Photocatalytic Activity of TiO2-MoS2 Heterostructures under Visible-Infrared Light by N. Cruz-González, O. Calzadilla, J. Roque, F. Chalé-Lara, J. K. Olarte, M. Meléndez-Lira, M. Zapta-Torres

“…The properties of the samples were analyzed by scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), X-ray diffraction (XRD), nitrogen adsorption-desorption isotherms, UV-Vis diffuse reflectance spectroscopy (UV-Vis-DRS), and X-ray photoelectron spectroscopy (XPS). …”
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Structural and Optical Properties of Amorphous Al2O3 Thin Film Deposited by Atomic Layer Deposition by Shuzheng Shi, Shuo Qian, Xiaojuan Hou, Jiliang Mu, Jian He, Xiujian Chou

“…The surface topography investigated by atomic force microscopy (AFM) showed that the samples were smooth and crack-free. …”
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Optical Observations of Sputtered Au-nanostructures and Characterizations by Sabah Jameel Mezher, Mohammed O. Dawood, Bahjat B. Kadhim

“…Au nanofilms were investigated by XRD (X-ray diffraction), UV-Vis (ultraviolet-visible light) diffractometer, and AFM (atomic force microscopy) techniques. The thicknesses of the three films prepared at different sputtering times (10, 15, and 20 seconds) were calculated using the theoretical deposition formula method. …”
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RETRACTED ARTICLE: Synthesis of silver nanoparticles using Plantago lanceolata extract and assessing their antibacterial and antioxidant activities by Muhammad Zahir Shah, Zheng-Hui Guan, Ala Ud Din, Amjad Ali, Ata Ur Rehman, Kashif Jan, Shah Faisal, Shah Saud, Muhammad Adnan, Fazli Wahid, Saud Alamri, Manzer H. Siddiqui, Shamsher Ali, Wajid Nasim, Hafiz Mohkum Hammad, Shah Fahad

“…The existence of nanoparticles (NPs) was confirmed by color shift, atomic force microscopy (AFM), and UV–Vis’s spectroscopy. …”
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