Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons by Andre M. P. Mattos, Douglas A. Santos, Luigi Dilillo

“…In this context, we propose the analysis and characterization of software applications’ reliability on a novel RISC-V-based processing system: Microchip’s PolarFire System-on-Chip (SoC). For that, we introduce reliability benchmarks using baremetal and FreeRTOS implementations and perform an experimental evaluation using high-energy protons, reporting Single-Event Effects (SEE) cross sections and the impact of Total Ionizing Dose (TID). …”
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