Hard X-ray single-shot spectrometer of PAL-XFEL by Sangsoo Kim, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong-jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, Jangwoo Kim

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Development of MHz X-ray phase contrast imaging at the European XFEL by Jayanath C. P. Koliyadu, Daniel Moško, Eleni Myrto Asimakopoulou, Valerio Bellucci, Šarlota Birnšteinová, Richard Bean, Romain Letrun, Chan Kim, Henry Kirkwood, Gabriele Giovanetti, Nerea Jardon, Janusz Szuba, Trey Guest, Andreas Koch, Jan Grünert, Peter Szeles, Pablo Villanueva-Perez, Fabian Reuter, Claus-Dieter Ohl, Mike Andreas Noack, Francisco Garcia-Moreno, Zuzana Kuglerová-Valdová, Libor Juha, Martin Nikl, Wataru Yashiro, Hitoshi Soyama, Daniel Eakins, Alexander M. Korsunsky, Jozef Uličný, Alke Meents, Henry N. Chapman, Adrian P. Mancuso, Tokushi Sato, Patrik Vagovič

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The Heisenberg-RIXS instrument at the European XFEL by Justine Schlappa, Giacomo Ghiringhelli, Benjamin E. Van Kuiken, Martin Teichmann, Piter S. Miedema, Jan Torben Delitz, Natalia Gerasimova, Serguei Molodtsov, Luigi Adriano, Bernard Baranasic, Carsten Broers, Robert Carley, Patrick Gessler, Nahid Ghodrati, David Hickin, Le Phuong Hoang, Manuel Izquierdo, Laurent Mercadier, Giuseppe Mercurio, Sergii Parchenko, Marijan Stupar, Zhong Yin, Leonardo Martinelli, Giacomo Merzoni, Ying Ying Peng, Torben Reuss, Sreeju Sreekantan Nair Lalithambika, Simone Techert, Tim Laarmann, Simo Huotari, Christian Schroeter, Burkhard Langer, Tatjana Giessel, Jana Buchheim, Grzegorz Gwalt, Andrey Sokolov, Frank Siewert, Robby Buechner, Vinicius Vaz da Cruz, Sebastian Eckert, Chun-Yu Liu, Christian Sohrt, Christian Weniger, Annette Pietzsch, Stefan Neppl, Friedmar Senf, Andreas Scherz, Alexander Föhlisch

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