Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers by Nozomu Hiraoka

Subjects: “…x-ray raman scattering…”
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The Heisenberg-RIXS instrument at the European XFEL by Justine Schlappa, Giacomo Ghiringhelli, Benjamin E. Van Kuiken, Martin Teichmann, Piter S. Miedema, Jan Torben Delitz, Natalia Gerasimova, Serguei Molodtsov, Luigi Adriano, Bernard Baranasic, Carsten Broers, Robert Carley, Patrick Gessler, Nahid Ghodrati, David Hickin, Le Phuong Hoang, Manuel Izquierdo, Laurent Mercadier, Giuseppe Mercurio, Sergii Parchenko, Marijan Stupar, Zhong Yin, Leonardo Martinelli, Giacomo Merzoni, Ying Ying Peng, Torben Reuss, Sreeju Sreekantan Nair Lalithambika, Simone Techert, Tim Laarmann, Simo Huotari, Christian Schroeter, Burkhard Langer, Tatjana Giessel, Jana Buchheim, Grzegorz Gwalt, Andrey Sokolov, Frank Siewert, Robby Buechner, Vinicius Vaz da Cruz, Sebastian Eckert, Chun-Yu Liu, Christian Sohrt, Christian Weniger, Annette Pietzsch, Stefan Neppl, Friedmar Senf, Andreas Scherz, Alexander Föhlisch

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