АНАЛИЗ КАЧЕСТВА МУЧНЫХ КОНДИТЕРСКИХ ИЗДЕЛИЙ С ИСПОЛЬЗОВАНИЕМ МЕТОДА РАЗВЕРТЫВАНИЯ ФУНКЦИИ КАЧЕСТВА... by Ирина Юрьевна Резниченко, Дарья Дмитриевна Агеенко, Михаил Сергеевич Щеглов

Subjects: “…quality deployment function, consumer preferences matrix, wafers with fillings, consumer expectations, technical characteristics…”
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Investigation of the Effects of Wafer-Baking Plates on Thermal Distribution, Wafer Thickness, and Wafer Color Distribution by Uğur Köklü, Abdullah Sadık Tazegül, Fatih Serin, Gültekin Basmacı

Subjects: “…wafer-baking oven…”
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Solid‐Solution Limits and Thorough Characterization of Bulk β‐(AlxGa1‐x)2O Single Crystals Grown by the Czochralski Method by Zbigniew Galazka, Andreas Fiedler, Andreas Popp, Palvan Seyidov, Saud Bin Anooz, Roberts Blukis, Jana Rehm, Kornelius Tetzner, Mike Pietsch, Andrea Dittmar, Steffen Ganschow, Arub Akhtar, Thilo Remmele, Martin Albrecht, Tobias Schulz, Ta‐Shun Chou, Albert Kwasniewski, Manuela Suendermann, Thomas Schroeder, Matthias Bickermann

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DESIGN PRINCIPLES AND BLOCK SCHEMES OF THE PROBE AUTOMATIC INSPECTION SYSTEMS FOR MICROAND NANOELECTRONICS ON A WAFER by V. A. Minchenko, G. F. Kovalchuk, S. B. Shkolyk

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Deep learning driven silicon wafer defect segmentation and classification by Rohan Ingle, Aniket K. Shahade, Mayur Gaikwad, Shruti Patil

Subjects: “…Wafer Defect Segmentation and classification using Deep Learning…”
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IMPLEMENTATION OF AN OCCLUSAL WAFER IN SEVERE MANDIBULAR FRACTURE CASES WITH POST-ORIF MALOCCLUSION: A CASE SERIES by Chintia Amelia Pratiwi, Mirnasari Amirsyah, Teuku Nanda Putra

Subjects: “…occlusal wafer…”
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Collinear Terahertz Generation from LiNbO₃ Wafer Driven by an Ultrafast Yb-Laser by Kang Wang, Hongyang Li, Zhuorui Zheng, Yi Liu, Ye Tian, Liwei Song

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An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection by Mengyun Li, Xueying Wang, Hongtao Zhang, Xiaofeng Hu

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A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL) by Pedram Aridas, Narendra Kumar, Anis Salwa Mohd Khairuddin, Daniel Ting, Vivek Regeev

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Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning by Jeongjoon Hwang, Somi Ha, Dohyun Kim

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High‐Efficiency Flexible GaAs/InGaAs Dual‐Junction Solar Cells Fabricated by Metallic Nanoparticle‐Based Wafer Bonding by Yeongho Kim, Suho Park, Thuy Thi Nguyen, Jiyeon Jeon, Byong Sun Chun, Sang Jun Lee

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The Effect of Metal Shielding Layer on Electrostatic Attraction Issue in Glass–Silicon Anodic Bonding by Wenqi Yang, Yong Ruan, Zhiqiang Song

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Structure of Silicon Wafers Planar Surface before and after Rapid Thermal Treatment by U. A. Pilipenko, A. A. Sergeichik, D. V. Shestovski, V. A. Solodukha

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Investigation the CMP process of 6 H-SiC in H2O2 solution with ReaxFF molecular dynamics simulation by Yanzhang Gu, Kaiping Feng, Lanxing Xu, Liang Zhao, Tianchen Zhao, Binghai Lyu

Subjects: “…6H-SiC wafer…”
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Semi-Supervised Learning With Wafer-Specific Augmentations for Wafer Defect Classification by Uk Jo, Seoung Bum Kim

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STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

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Secure interface architecture for the software defined system on wafer by LI Peijie, SHEN Jianliang, GUO Wei, CAO Zhipeng, MEI Bo

Subjects: “…software defined system on wafer…”
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Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

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Wafer-Scale Monolithic Integration of LEDs with p-GaN-Depletion MOSFETs on a GaN LED Epitaxial Layer by Boseong Son, Huijin Kim, Young-Woong Lee, Purusottam Reddy Bommireddy, Si-Hyun Park

Subjects: “…Wafer-scale monolithic integration…”
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RESEARCH PROGRESS ON CUTTING TECHNOLOGY OF SIC MONO-CRYSTAL WAFER WITH WIRE SAW by LI Lun, LI ShuJuan, TANG AoFei, LI Yan

Subjects: “…SiC mono-crystal wafer…”
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