Generation of address sequences with a given switching activity by V. N. Yarmolik, N. A. Shevchenko

Subjects: “…testing of computing systems…”
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Transparent memory testing based on dual address sequences by V. N. Yarmolik, I. Mrozek, V. A. Levantsevich, D. V. Demenkovets

Subjects: “…testing of computing systems…”
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Formal description model and conditions for detecting linked coupling faults of the memory devices by V. N. Yarmolik, D. V. Demenkovets, V. V. Petrovskaya, A. A. Ivaniuk

Subjects: “…testing of computing systems…”
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Pseudoexhaustive memory testing based on March A type march tests by V. N. Yarmolik, I. Mrozek, S. V. Yarmolik

Subjects: “…testing of computing systems…”
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Construction and application of march tests for pattern sensitive memory faults detection by V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets, I. Mrozek

Subjects: “…testing of computer systems…”
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Transparent memory tests with even repeating addresses for storage devices by V. N. Yarmolik, I. M. Mrozek, V. A. Levantsevich, D. V. Demenkovets

Subjects: “…testing of computer systems…”
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