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Search Results - "short-circuit (SC) robustness"
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"short-circuit (SC) robustness"
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Short-Circuit Performance Analysis of Commercial 1.7 kV SiC MOSFETs Under Varying Electrical Stress
by
Shahid Makhdoom
,
Na Ren
,
Ce Wang
,
Yiding Wu
,
Hongyi Xu
,
Jiakun Wang
,
Kuang Sheng
Published 2025-01-01
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Institution
Kabale University
1 results
1
Format
Article
1 results
1
Author
Ce Wang
1 results
1
Hongyi Xu
1 results
1
Jiakun Wang
1 results
1
Kuang Sheng
1 results
1
Na Ren
1 results
1
Shahid Makhdoom
1 results
1
Yiding Wu
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Language
English
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