Showing 121 - 140 results of 685 for search '"semiconductors"', query time: 0.04s Refine Results
  1. 121

    Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion by Valeriy V. Yatsyshen, Irina I. Borodina

    Published 2024-12-01
    “…The paper presents the results of calculations of the frequency and angular spectra of the ellipsometric parameters of reflected light for a CdS semiconductor crystal near the exciton resonance, taking into account spatial dispersion. …”
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  2. 122

    A Study of the Talent Training Project Management for Semiconductor Industry in Taiwan: The Application of a Hybrid Data Envelopment Analysis Approach by Ling-Jing Kao, Shu-Yu Chiu, Hsien-Tang Ko

    Published 2014-01-01
    “…The purpose of this study is to evaluate the training institution performance and to improve the management of the Manpower Training Project (MTP) administered by the Semiconductor Institute in Taiwan. Much literature assesses the efficiency of an internal training program initiated by a firm, but only little literature studies the efficiency of an external training program led by government. …”
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    Elastic Properties and the Band Gap of AlNxP1-x Semiconductor Alloy: A Comparative Study of Various Ab Initio Approaches by M. P. Polak, M. J. Winiarski, K. Wittek, P. Scharoch

    Published 2016-01-01
    “…Structural and elastic properties of AlNxP1-x, a novel semiconductor alloy, are studied from the first principles in both zinc-blende and wurtzite structures. …”
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  8. 128

    Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model by Rajesh Doss, Jayabrabu Ramakrishnan, S. Kavitha, S. Ramkumar, G. Charlyn Pushpa Latha, Kiran Ramaswamy

    Published 2022-01-01
    “…The silicon wafer is one of the raw materials used to make semiconductor chipsets. Semiconductor failure or dysfunction could be the result of defects in the layers of this material. …”
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    Improving the Selectivity of Metal Oxide Semiconductor Sensors for Mustard Gas Simulant 2-Chloroethyl Ethyl Sulfide by Combining the Laminated Structure and Temperature Dynamic Modulation by Yadong Liu, Siyue Zhao, Lijuan You, Yong Xu, Renjun Si, Shunping Zhang

    Published 2025-01-01
    “…Insufficient selectivity is a major constraint to the further development of metal oxide semiconductor (MOS) sensors for chemical warfare agents, and this paper proposed an improved scheme combining catalytic layer/gas-sensitive layer laminated structure with temperature dynamic modulation for the Mustard gas (HD) MOS sensor. …”
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    A 22% Efficient Semiconductor/Liquid Junction Solar Cell—the Photoelectrochemical Behavior of n-WSe2 Electrodes in the Presence of I2/I- in Aqueous Electrolyte by G. Campet, C. Azaiez, F. Levy, H. Bourezc, J. Claverie

    Published 1988-01-01
    “…One of the most efficient semiconductor/liquid-junction photoelectrochemical cells (PEC) reported to date is presented. …”
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  19. 139

    Comparative Study of SiO2, Al2O3, and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices by J. H. Yum, J. Oh, Todd. W. Hudnall, C. W. Bielawski, G. Bersuker, S. K. Banerjee

    Published 2012-01-01
    “…In this paper, we compare the electrical characteristics of inserting an ultrathin interfacial barrier layer such as SiO2, Al2O3, or BeO between the HfO2 gate dielectric and Si substrate in metal oxide semiconductor capacitors (MOSCAPs) and n-channel inversion type metal oxide semiconductor field effect transistors (MOSFETs). …”
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