Showing 1 - 4 results of 4 for search '"semiconductor wafer"', query time: 0.02s Refine Results
  1. 1
    DESIGN PRINCIPLES AND BLOCK SCHEMES OF THE PROBE AUTOMATIC INSPECTION SYSTEMS FOR MICROAND NANOELECTRONICS ON A WAFER

    DESIGN PRINCIPLES AND BLOCK SCHEMES OF THE PROBE AUTOMATIC INSPECTION SYSTEMS FOR MICROAND NANOELECTRONICS ON A WAFER by V. A. Minchenko, G. F. Kovalchuk, S. B. Shkolyk

    Published 2015-04-01
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  2. 2
    A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)

    A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL) by Pedram Aridas, Narendra Kumar, Anis Salwa Mohd Khairuddin, Daniel Ting, Vivek Regeev

    Published 2025-01-01
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  3. 3
    STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL

    STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

    Published 2015-03-01
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  4. 4
    Universal Digital Probe Electrometer for Testing Semiconductor Wafers

    Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

    Published 2023-10-01
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