Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack by R. B. Burlakov

Subjects: Get full text

New materials based on InP-ZnS system for semiconductor gas analyzers by I. A. Kirovskaya, R. V. Ekkert, A. O. Ekkert, E. V. Mironova, I. Yu. Umansky, A. I. Blesman, D. A. Polonyankin, L. V. Kolesnikov, E. N. Kopylova, V. B. Goncharov

Subjects: Get full text

Evolution of the Radiation Shielding, Optical, and Luminescence Properties of PbO₂-SiO₂ Glass Systems and the Influence of Rare Earth Elements (Eu, Ce, Yb) by Mioara Zagrai, Ramona-Crina Suciu, Radu Cristian Gavrea, Vasile Rednic

Subjects: Get full text

Surface patterning of wide-gap semiconducting β-Ga2O3 thin films by area selective crystallization via room-temperature excimer laser annealing and low-toxic wet etching processes by Daishi Shiojiri, Ryoya Kai, Satoru Kaneko, Akifumi Matsuda, Mamoru Yoshimoto

Subjects: Get full text

Improving energy efficiency of power electric power plants of low-tonnage passenger ships by А. F. Burkov, V. V. Mikhanoshin, V. K. Nguyen

Subjects: Get full text

Room Temperature Terahertz and Frequency Combs Based on Intersubband Quantum Cascade Laser Diodes: History and Future by Manijeh Razeghi, Quanyong Lu

Subjects: Get full text

Modelling of structural, mechanical, electronic, and optical properties of Rb2TlXF6 (X = Ir, Rh) double perovskite compounds through density functional theory by Wasi Ullah, Nasir Rahman, Mudasser Husain, Wafa Mohammed Almalki, Khamael M. Abualnaja, Ghaida Alosaimi, Soufyane Belhachi, Bashar.M. Al-Khamiseh, Vineet Tirth, Ahmed Azzouz-Rached, Hanan A. Althobaiti, Farooq Ali

Subjects: Get full text

Numerically Efficient and Accurate Analytical Converter Semiconductor Loss Calculation for Hybrid and Modular Multilevel Converters in VSC-HVDC Applications by Levi Bieber, Liwei Wang, Juri Jatskevich

Subjects: Get full text

Thermodynamic study of semiconducting related materials by use of EMF method with solid electrolyte by Katayama Iwao, Tanaka Toshihiro, Iida Takamichi

Subjects: Get full text

Propagation characteristics of surface waves on half-space of piezoelectric semiconductor with rotation effect considered by Li Li, Tong Wu, Qian Zhang

Subjects: “…Piezoelectric semiconductor…”
Get full text

Physics-Based Compact Model of Independent Dual-Gate BEOL-Transistors for Reliable Capacitorless Memory by Lihua Xu, Kaifei Chen, Zhi Li, Yue Zhao, Lingfei Wang, Ling Li

Subjects: Get full text

A Physics-Based Compact DC Model for AOS TFTs Considering Effects of Active Layer Thickness Variation by Minxi Cai, Wei Zhong, Bei Liu, Piaorong Xu, Jing Cao

Subjects: “…Amorphous oxide semiconductor (AOS) thin-film transistors (TFTs)…”
Get full text

STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

Subjects: Get full text

Devices for express diagnostics of power semiconductor devices and semiconductor converters by E. B. Koroleva, S. M. Kurmashev, K. K. Kim, A. A. Tkachuk, A. A. Kuznetsov

Subjects: “…semiconductor device…”
Get full text

Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

Subjects: Get full text

A 32 μm² MOS-Based Remote Sensing Temperature Sensor with 1.29 °C Inaccuracy for Thermal Management by Ruohan Yang, Kwabena Oppong Banahene, Bryce Gadogbe, Randall Geiger, Degang Chen

Subjects: “…complementary metal oxide semiconductor (CMOS) temperature sensor…”
Get full text

ZnO/MO_x Nanofiber Heterostructures: MO_x Receptor’s Role in Gas Detection by Vadim Platonov, Oleg Sinyashin, Marina Rumyantseva

Subjects: Get full text

Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S₂₂ and h₂₁: An Effective Machine Learning Approach by Zegen Zhu, Gianni Bosi, Antonio Raffo, Giovanni Crupi, Jialin Cai

Subjects: Get full text

Novel source/drain contact structure for a-IGZO devices: Oxygen-scavenger-layer metal-interlayer-semiconductor (OSL MIS) approach by Sungjoo Song, Jong-Hyun Kim, Jongyoun Park, Seung-Hwan Kim, Dongjin Ko, Hyejung Choi, Seiyon Kim, Hyun-Yong Yu

Subjects: Get full text

Defect modeling in semiconductors: the role of first principles simulations and machine learning by Md Habibur Rahman, Arun Mannodi-Kanakkithodi

Subjects: Get full text